Integrated circuits can emit light when activated. Light EMission MIcroscopy (EMMI) uses this physical phenomenon to precisely localize specific areas in the silicon chip. By comparing differences in the emissions, it is possible to localize die level defects.
In addition, we can localize signal propagation failures by performing temporal analysis of the emitted light (TRE, Time Resolved Emission, TRI, Time Resolved Imaging).
Application
“Static mode”
Short circuit localization, overconsumption, analysis of internal activity of the chip and memory descrambling
Application
“Dynamic mode”
Transient leakage current localization,
Signal propagation detection,
Analysis of delay between two signals,
Frequency anomaly detection
See below to find our other techniques
