A Scanning Elecron Microscope (SEM) is used to visualize the morphology, the chemical composition and the crystallography of the samples at high resolution. Thanks to Energy-dispersive X-ray spectroscopy analysis (EDX) it is possible to identify the elements which are present in the sample.
Applications
- Sample morphology visualization
- Composition contrast image (using backscattered electrons)
- Chemical composition analysis through X-Rays generation (EDX)
- Analysis of optoelectronic behaviour of semiconductors using cathodoluminescence
- Depletion zones visualization (EBIC)
Topgraphical
visualization
Visual inspection,
defect visualization
Atomic number
contrast imaging
Different materials visualization
EDX
Microanalysis
Identification and localization of chemical elements of the sample
See below to find our other techniques
