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Intraspec Technologies
About us
Your technologies
Integrated circuits
PCB and assemblies
Passives and discretes
Optoelectronic components
Our techniques
Electrical and electro-optical characterisations
Focused Ion Beam
Light emission microscopy
Electron microscopy
Magnetic Microscopy
Optical Microscopy
Sample preparation
Die Thinning
X-Ray Imaging and Computed Tomography
Time Domain Reflectometry
SEE sensitivity
Laser techniques
Assembly test
Lock-in Thermography
Accelerated ageing
Our services
Failure analysis
Entry Control
Reliability
Qualification
Space EMC derisking
Tools sales
R&D
News
Contact us
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Our
techniques
See below to find our
techniques